Yield Enhancement by Robust Application-specific Mapping on Network-on-Chips
Dutta Choudhury A., Palermo G., Silvano C., Zaccaria V.
Contributo in atti di conferenza
The current technological defect densities and production yields are a motivating factor supporting the introduction of design-for-manufacturability techniques during the highlevel design of complex, embedded systems based on networkon- chips (NoCs). In this context, we tackle the problem of mapping the IPs of a multi-processing system to the NoC nodes, by taking into account the effective robustness of the system with respect to permanent faults in the interconnection network due to manufacturing defects. In particular, we introduce an application specific methodology for identifying optimal NoCs mappings which minimize the variance of the system power and latency and maximizes the probability that the actual system will work when deployed, even in presence of faulty NoC links. We provide experimental results by comparing the proposed methodology with conventional mapping approaches, by highlighting benefits and drawbacks of both techniques
Atti di conferenza
NoCArc''09: Proceedings of the Second International Workshop on Network on-Chip Architectures
New York City, USA