Spectral Analysis of the Relation between Deep Learning Faults and Neural Activation Values
Additional information
Authors
Humbatova N.,
Jahangirova G.,
Tonella P.
Type
Article in conference proceedings
Year
2024
Language
English
Conference proceedings
Proc. of the 2024 IEEE Conference on Software Testing, Verification and Validation (ICST)
Meeting name
2024 IEEE Conference on Software Testing, Verification and Validation (ICST)
Meeting place
Toronto, ON, Canada
Meeting date
2024
Diffusion
License
License undefined
Visibility
Private
