An Empirical Study on Low- and High-Level Explanations of Deep Learning Misbehaviours
Additional information
Authors
Zohdinasab T.,
Riccio V.,
Tonella P.
Type
Article in conference proceedings
Year
2023
Language
English
Conference proceedings
Proc. of the 2023 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Meeting name
2023 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)
Meeting place
New Orleans, LA, USA
Meeting date
2023
Diffusion
License
License undefined
Visibility
Private
