DeepAtash: Focused Test Generation for Deep Learning Systems
Additional information
Authors
Zohdinasab T.,
Riccio V.,
Tonella P.
Type
Article in conference proceedings
Year
2023
Language
English
Conference proceedings
Proc. of ISSTA '23: 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis
Meeting name
ISSTA '23: 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis
Meeting place
Seattle WA USA
Meeting date
2023
Diffusion
License
License undefined
Visibility
Private
