A Review and Refinement of Surprise Adequacy
Additional information
Authors
Weiss M.,
Chakraborty R.,
Tonella P.
Type
Article in conference proceedings
Year
2021
Language
English
Conference proceedings
Proc. of the 2021 IEEE/ACM Third International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest)
Meeting name
2021 IEEE/ACM Third International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest)
Meeting place
Madrid, Spain
Meeting date
2021
Diffusion
License
License undefined
Visibility
Private
