Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-Threshold Devices through an Example of a 65nm AES Implementation
Additional information
Authors
Barenghi A.,
Hocquet C.,
Bol D.,
Standaert F.,
Regazzoni F.,
Koren I.
Type
Article in conference proceedings
Year
2011
Language
English
Conference proceedings
7th Workshop on RFID Security and Privacy (RFIDSec)
Month
June
Meeting place
Amherst, Massachussets, USA
